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Congratulations to Zhao Yang, Hui Liu and Jianhong Lin with the publishing of their paper "Modeling and simulations of the cascading failure of multiple interdependent R&D networks under risk propagation"
Authors: Hui Liu, Naiding Yang, Zhao Yang, Yanlu Zhang, Jianhong Lin
More information on the paper.
Abstract: In this paper, we study the robustness of multiple interrelated R&D networks under risk propagation. Firstly, using a bi-partite graph to represent the interrelated R&D networks is emphasized and proposed. Secondly, a risk propagation model is built by defining risk load and risk capacity of each enterprise on a specific R&D network, Thirdly, we use simulations to study risk propagation in interrelated R&D networks. Our results indicate that there exist three critical thresholds to quantify the robustness of R&D networks. Risk propagation in R&D networks is highly affected by the heterogeneity of all enterprises' scales and risk capacities.